JTAG boundary scan test development
Boundary-scan tests ensure improved quality of the developed devices. The primary benefit of the boundary-scan technology is the ability to test devices with limited access to microcircuit package leads, such as BGA, COB, and QFP.
Promwad has the necessary engineering resources and software for development of a full-scale set of testing applications for the JTAG Technologies systems. Because of this our clients can count on the maximum possible fault coverage for all digital circuits in their new electronic devices.
Our hardware development projects
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